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SEE Testing

A modular system of circuit boards has been developed for the purpose of performing investigations into single-event effects (SEE) on a variety of devices. The device-under-test (DUT) is typically subjected to ionizing radiation, such as neutrons, in order to provoke an upset.

The system consists of a set of circuit boards. Some of these boards contain the target devices, such as field-programmable gate arrays (FPGA), and others provide facilities such as display, switching, I-O, clock sources and power convertors. Together, these boards provide the target device with the power, clocking and programming necessary to run the DUT, and to detect and record any errors in the DUT's functioning.

Apart from a vendor-independent range of FPGAs, the platforms for the target devices will include a growing range of microprocessors and other devices. The particular devices for which circuit boards are being developed is subject to requests made by potential customers. If you have any requirements to subject a specific device to SEE or similar tests, please let us know at E-mail: info-SEE_target AT

The system is highly configurable, and lends itself to a wide range of applications in electronics for experimenting, teaching, training and prototyping purposes. More details of the system are available in our Prototyping Systems section.